We provide the widest range of tools to measure sheet resistance by both contact (by 4 point Mercury probe) and non-contact method. 

For contact type measurement, we use Mercury probe. This permits our systems to probe and characterize a wide range of materials , including semi-conductors , oxides, dielectrics , SOI (Silicon on Insulator ), and films on conducting or insulating substrates.

• small low budget manually operated systems
• research and development oriented desktop systems
• production-line oriented fully automated cassette to cassette systems capable of handling wafers up to 300mm in diameter or flat panels
• customized tools

For non-contact type measurement, we use Eddy current for sheet resistance measurements. Its accuracy and its ability to measure in contactless mode has a special user value. Key benefits of eddy current resistance testing are:  

• Non-contact mode
• Ultra-fast (20 ms / measurement)
• High repeatability and accuracy
• Large distances from sensor to substrate
• Transmission mode and reflective mode
• Measurement through encapsulation
• No wearing
• Large measurement range from 0.1 mOhm/sq to 100 kOhm/sq (9 decades)

We have wide range of testing devices for Industry and R&D laboratories.

• Handheld
• Laboratory / Benchtop
  • Single point
  • Imaging
• Inline / Tool integrated
  • Inline static single / multi-sensor
  • Inline transversing
  • Robot / tool integration